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Exhibitors Inventions

Seoul International Invention Fair
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Exhibitors inventions 게시글의 상세 화면
Title Geometric parameters measurement method of cutters
Department Machinery/Engines/Tools/Industrial Process/Metallurgical Year 2014
Company National Yunlin University of Science and Technology Regist No Patent No: R.O.C. I 374253 Date 2014-12-15
In this invention, the method for measurement of geometrical parameters of a cutter has been developed. The measurement steps include image threshold process, positions of the cutter profile, parameter analysis, and formulation of equations and acquirement of geometrical parameters of the cutter. Then, the least square method is utilized for obtaining linear equations of profile and the center line in the cutter??s image. By linear equation of the cutter??s profile and center line, angular and dimensional parameters of the cutter can be calculated.
Exhibitors inventions 게시판의 이전글 다음글
이전글 Preview The device of swirl jet assisted laser micromachining
이전글 Next The Generate Electricity Apparatus in Concentrating Solar
SIIF 2020 Seoul International Ivention Fair 2020
Korea Intellectual Property Service Center 17F, 131 Teheran-ro, Gangnam-gu, Seoul, Republic of Korea 06133
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