미디어

  • 2019
  • 2018
  • 2017
  • 2016

2016

Seoul International Invention Fair
SIIF 는 전문적인경험과 지식을 가지고 있으며
성공적인 발명전시회를 개최할 수 있도록 노력하겠습니다.
전시선정기술 게시글의 상세 화면
제목 Geometric parameters measurement method of cutters
분야 기계/엔진/공구/산업용공정/야금 년도 2014
업체명 National Yunlin University of Science and Technology 등록번호 Patent No: R.O.C. I 374253 등록일 2014-12-15
In this invention, the method for measurement of geometrical parameters of a cutter has been developed. The measurement steps include image threshold process, positions of the cutter profile, parameter analysis, and formulation of equations and acquirement of geometrical parameters of the cutter. Then, the least square method is utilized for obtaining linear equations of profile and the center line in the cutter??s image. By linear equation of the cutter??s profile and center line, angular and dimensional parameters of the cutter can be calculated.
전시선정기술 게시판의 이전글 다음글
이전글 이전글 The device of swirl jet assisted laser micromachining
이전글 다음글 The Generate Electricity Apparatus in Concentrating Solar
SIIF 2020 Seoul International Ivention Fair 2020
서울시 강남구 테헤란로 131(역삼동 647-9) 한국지식재산센터 17층 국제협력실
TEL : 02)3459-2843 / 2924    FAX : 02)3459-2879    EMAIL : siif@kipa.org